質問：
What are C-V measurements?
回答：
C-V refers to Capacitance vs. Voltage. C-V measurements are an integral part of semiconductor device characterization. C-V measurements are used to see how the capacitance of a semiconductor device varies with voltage. C-V is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime. Keithley s Model 590 and 595 are designed for C-V measurements.
FAQの該当製品：
製品シリーズなし
製品：
FAQ ID 70701
すべてのFAQを表示 »