PCI Express

PCI Express

テクトロニクスのテスト・ソリューションは、PCIe設計の解析、検証、事前適合テストを迅速に実行します。

トランスミッタとレシーバの両方のテストに対応した計測器と解析ソフトウェアにより、現在および次世代のPCIe仕様(Gen1、2、3、および PCIe 4.0規格)に準拠した、詳細な解析、コンプライアンス・テスト、およびデバッグが可能です。

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ライブラリ

Title
Overcoming Receiver Test Challenges in Gen4 I/O Applications

This new application note provides vital information on performing compliance and diagnostic tests for Gen4 enterprise receivers with Bit Error Rate Testers.  

Logic Analyzer Fundamentals

Learn the basics and benefits of logic analyzers - see how this tool can solve your debug challenges.

Overcoming PCI-Express Physical Layer Challenges

Using the powerful triggering and multiple data views of the Tektronix Logic Protocol Analyzer to overcome physical layer challenges.

Understanding and Characterizing Timing Jitter Primer

Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems.

Hunting PCIE Flow Control Bugs

This white paper describes in detail the use of the Bird's Eye View (BEV), a completely new visualization, to investigate flow control.

トリガ入門Pinpointトリガの機能と性能によって、高速デジタル設計における最も発生頻度の低い現象をピンポイントで特定できるようになります。この入門書では、トリガの基本およびPinpointトリガによって、リアルタイム・オシロスコープのトリガがどのように高性能化されているかについて説明します。
PCI Express Probing Solutions with the Tektronix Protocol Analyzer

This white paper discusses how to ensure proper board design and layout for digital debug and verification using the Tektronix PCIe Protocol Analyzer.

PCI Express® Transmitter PLL Testing — A Comparison of Methods

Overview of significant methods for performing PLL Testing

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission & to explain the analog and digital measurement requirements that apply to these emerging serial technologies

Understanding the Transition to Gen4 Enterprise & Datacenter I/O Standards

This whitepaper provides important information about adaptive equalization and link training, the impact of forward error correction (FEC) on compliance testing, debugging protocol handshaking and physical layer issues and new trends in channel performance evaluation along with other pertinent material when transitioning toGen4 standards.

Title
10 Things to Know about PCI Express

Understand the important aspects of this continually changing standard with an overview of what’s new in PCIe Gen4, key considerations in setting up a comprehensive debug process, including loopback initiation and protocol handshaking, along with procedures of transmitter and receiver testing to keep in mind and more.

Debug physical layer and link training issues quickly for standards running up to…

2:12

The MSO/DPO70000 Series oscilloscope delivers exceptional signal acquisition…

5:49

In this video we look at a topic that is becoming increasingly important in the…

4:13
タイトル
Addressing PCIe Gen1-5 Test and Debug Challenges with Confidence

Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and debug for PCIE Gen1-5.

Getting to PCI Express Compliance Faster

This webinar will provide the information on test processes for PCIe devices to allow you to reach compliance faster.

Overcoming Challenges in PCI Express Compliance Testing

Learn the keys to debugging, verifying design and performing interoperability testing for PCI Express revisions 3.0 and 4.0.

Title
PCIe Gen 3.0 Link Equalization System and Add-in Card Test Procedure

Tektronix PCI Express Gen3 Link EQ test MOI. This document cover Link EQ testing for both System DUT and Add-In Card.

PCI Express 3.0 PLL Test MOI for Add-In Cards

This document covers the Method of Implementation (MOI) for PCI Express 3.0 Phase-Lock-Loop (PLL) testing for Add-In Cards (AIC).

PCI Express 3.0 System Transmitter Test MOI

This document covers the Method of Implementation (MOI) for PCI Express 3.0 CEM and U.2 System transmitter testing, using DPO70000 Series Oscilloscopes.

PCI Express 3.0 Receiver Test MOI for BASE Spec

This document covers the Method of Implementation (MOI) for PCI Express 3.0 BASE receiver testing, using BERTScope instruments.

PCI Express 3.0 Card Transmitter Test MOI

This document covers the Method of Implementation (MOI) for PCI Express 3.0 CEM and U.2 card transmitter testing, using DPO70000 Series Oscilloscopes.

PCIe Gen3 (8GT/s) Receiver Jitter Tolerance Test MOI

This document covers the Method of Implementation (MOI) for PCIe Gen3 (8GT/s) Receiver Jitter Tolerance Test (Add-In Card and System) using Tektronix BSX Series BERTScope Bit Error Tester and ‘BERTScope PCIE3.0 Receiver Testing’ Application.

Methods of Implementation (MOI) for Verification+ Debug and Characterization

This document covers the Method of Implementation (MOI) for DPOJet measurements provided in the DPO70000 Option PCE, Option PCE3, and Option PCE4 solutions packages.

PCI Express 3.0 De-embedding Method of Implementation Version 1.0

Methods of Implementation (MOI) for PCI Express 3.0 De-embedding

PCI Express 3.0 Receiver Test MOI for CEM Spec

This document covers the Method of Implementation (MOI) for PCI Express 3.0 CEM receiver testing, using BERTScope instruments.

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