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Serial Communications

Title
RC4 Wireless Lights It Up with Tektronix MSO2000 Series
James Smith at RC4 develops custom wireless dimming and control products, for high-profile clients like Cirque du Soleil and Disney. Find out how James used the MSO2024 to shave hours off …
On the Bleeding Edge: Tektronix Logic Analyzers Enable Tundra Semiconductor to Develop First RapidIO Switches and Get to Market Faster
Challenge: Design, verify and debug the industry’s first silicon switches supporting parallel and serial RapidIO® Solution: Tektronix TLA7000 Series logic analyzer with TMS805 RapidIO application …
PulseCore Semiconductor社様
テクトロニクスのUSBテスト・ソリューションとスペクトラム・アナライザを使用して、低EMIのUSB2.0チップを開
Logic Analyzer Fundamentals
Like so many electronic test and measurement tools, a logic analyzer is a solution to a particular class of problems. It is a versatile tool that can help you with digital hardware debug, design …
PCI ExpressTM測定入門
この入門歯では、PCIExpressにおける検証、デバッグ、コンブライアンスだけでなく、基本原理、測定テクニック、確実な設計に必要となるツールについても説明します。この入門歯は、Genlデバイスに対応し、これからGen2デバイスのテストを始める方、あるいはPCIExpressを始めたばかりの方であっても、PCIExpressのアーキテクチャ、仕様 …
SDH Telecommunications Standard Primer
SONET Telecommunications Standard Primer
What is SONET?This document provides an introduction to the Synchronous Optical NETwork (SONET) standard. Standards in the telecommunications field are always evolving. Information in this SONET …
Using Tektronix AWG7000 Series in Synchronous Applications
Synchronous test systems are becoming more important in many applications and being able reduce any uncertainty of when a trigger is sent, to when the signals are outputted is challenging for any …
RapidIOテストの理解と実践
RapidIOアーキテクチャは、次世代のネットワーク機器/通信機器に求められる、高速な伝送速度を実現します。実現には、コンプライアンスと相互運用性の問題が伴いますが、当社の統合ツール・セットでは、この問題を迅速かつ効率的に解決し、RapidIOを設計に簡単に取り入れることができます。
Overcoming a wide array of UWB test challenges: Part 1
複雑なDigRFテストのソリューション(英文)
どのような開発段階であっても、テスト機器には柔軟性が求められます。テスト機器は、検証だけでなく、DUT (被測定デバイス)が規格に準拠していることを確認できなければなりません。 テクトロニクスのDigRF ソリューションを使用することで、製品の性能を確実に把握し、いち早く市場に投入することができます。
Smiths Detection Relies on Tektronix to Take the Trouble out of Troubleshooting
A team of engineers at Smith Detection needed to quickly, efficiently and accurately identify and resolve problems during the development of complex handheld devices. Learn how Smith Detection …
Overcoming a wide array of UWB test challenges: Part 2
Complex UWB Signal Generation using Advanced Waveform Editing Tools
New RF transmission systems, like UBW-WiMedia, are proliferating. This is causing engineers to look for better ways to simulate intricate RF signal behaviors and interactions. At the same time, a push …
Eye Measurements on Optical RZ Signals
This technical brief describes several automatic eye measurements for RZ signals contained in Tektronix' DSA8200 sampling oscilloscope. Examples of real signals are presented, as well as guidelines …
Fluke/Tektronix Solutions Brochure
Fluke and Tektronix solutions for electronic design, manufacturing and service professionalsProfessionals designing the next award-winning electronic products or manufacturing 100% defect-free …
Correlation of 10GBASE-T Linearity Measurements on the Oscilloscope and Spectrum Analyzer
Read about the purity results of the DAC (used at the output) in a recent measurement conducted on transmitter linearity via Spurious Free Dynamic Range
Overcoming PCI-Express Physical Layer Challenges
This paper will present how the Tektronix Logic Protocol Analyzer is used to overcome these challenges using powerful triggering and multiple data views.
Compliance and Validation of SuperSpeed USB/PCIe Gen 3
Gain an updated understanding of open standards compliance test approaches and upcoming test specification releases in this informative session. See how Tektronix supports required Transmitter …
デジタル・ストレージ・オシロスコープによるイーサネット差動リターン・ロスの測定
要約: IEEE 802.3(参考文献[5])では、機器の互換接続性を確認するためのコンプライアンス・テストがい くつか規定されています。多くの場合、これらのテストはデジタル・ストレージ・オシロスコープと任意波形 ゼネレータを使用して実施できます。Media Dependent Interface(MDI)で発生するリターン・ロスのテスト は …
PCI Express Power State Management Validation and Debug Using the Tektronix Logic Protocol Analyzer
These solutions deliver the performance to capture, display, and analyze the most complex serial signals.
Receiver Test Solution Application Fact Sheet
Receiver testing poses one of the biggest challenges for designers who need to exercise and characterize emerging devices. This fact sheet presents the Tektronix Receiver Testing solution.
SDH Telecommunications Standard Primer
SDH (Synchronous Digital Hierarchy) is a standard for telecommunications transport formulated by the International Telecommunication Union (ITU), previously called the International Telegraph and …
SDH Telecommunications Standard Primer
SDH (Synchronous Digital Hierarchy) is a standard for telecommunications transport formulated by the International Telecommunication Union (ITU), previously called the International Telegraph and …
Serial Communications Testing Solutions
Support for Testing of Transmitter, Receiver, and InterconnectSerial data buses provide the networking, interconnect, and communication capability necessary to connect computers and embedded devices …
Hunting PCIE Flow Control Bugs
This white paper describes in detail the use of the Bird's Eye View (BEV), a completely new visualization, to investigate flow control. Not only does the BEV provide a full-acquisition view of the …
ディスク・ドライブ設計のための測定ソリューション
記載内容- ヘッドとメディア- プリアンプとリード/ライト信号- サーボ・ポジショニングはじめにHDD (Hard Disk Drive) 技術は数十年に渡り変化と進歩を遂げていますが、設計エンジニアの目標は基本的に変わっていません。それは、容量増大と高速化のあくなき追求です。今日のハード・ディスク・ドライブは、コンシューマ・デスクトップPC 用の普及品であっても …
Logic Analyzer Triggering Techniques to Capture Elusive Problems
For digital designers who need to verify and debug their product designs, logic analyzers provide breakthrough triggering features that capture real-time digital system operation. This application …
Finding and Examining Pattern-dependent Failures with FrameScan™ Acquisition Technology
As bit rates increase to 10 Gbps and beyond, pattern-dependent failures become much more common in the generation, transmission, and reception of signals in various data and communication products …
Overcoming High Speed Serial DataRX Testing Challenges Using an AWG and Direct Synthesis Application Note
With digital data prevalent in all forms of consumer products today, High Speed Serial Data testing is one of the biggest challenges for the design and testing of these popular devices. Manufacturers …
CANおよびLINの車載ネットワーク・テストの簡素化
車載ネットワークは、高速および低速の情報を処理する多くのモジュールを統合します。このため、ネットワークのテストは非常に困難な作業になります。これは、ネットワークの一部の要素(ノードなど)が、安全性や排気ガスの規制を満たすために高速データを処理する必要があるためです。その他のネットワーク要素としては、ヘッドライトやスイッチなど、低速の接続があります。 
Simplifying Validation and Debug of USB 3.1 Designs
This application note will explain the evolution of the Universal Serial Bus (USB) standard and testing approaches that have been developed to accommodate the increasing speed and complexity of this …
Creating Calibrated UWB WiMedia Signals
To maintain the integrity of signals over the whole band, pre-distorting the waveform becomes necessary, therefore the need to calibrate the whole system. This application note details the steps …
Cross-bus Analysis Reveals Interactions and Speeds Troubleshooting
Cross-bus analysis has become an indispensable troubleshooting methodology. This application note discusses how the powerful new logic analysis solution from Tektronix can speed your cross-bus …
Automatic Measurement Algorithms and Methods for High-Performance Communications Applications
This application note contains detailed information on CSA/TDS8000 Series algorithms and describes their use to generate and perform automatic measurements, emphasizing the analysis of multivalued …
Analyzing 8b/10b Encoded Signals with a Real-time Oscilloscope
This application note discusses troubleshooting and verifying devices with 8b/10b serial buses using the Tektronix MSO/DPO/DSA70000 Series oscilloscopes with their powerful real time triggering of …
TekExpress Software and MIPI® Physical Layer and Protocol Layer Testing
Understanding and performing MIPI® D-PHY physical layer, CSI and DSI protocol layer testing with Tektronix TekExpress software and oscilloscopes.
ロジック・アナライザとオシロスコープの統合によるシグナル・インテグリティの迅速なトラブルシューティング
製品開発を速めるには、シグナル・インテグリティ問題の迅速で効率的なトラブルシューティングが必要となります。シグナル・インテグリティ問題の一部は、高速のクロック・レートと高速のデジタル・エッジ・レートによって引き起こされます。たとえば、コンピュータ、通信、デジタル・ビデオ機器が大容量データを高速伝送する場合などは、こうした高速の伝送レートと共に、高速なエッジ・レートが必要となります。また …
Embedded Design Techniques for Developing Cost-Effective Communications
As embedded systems designs become more intelligent and connected, the communication links of these devices turn out to be increasingly important. At the same time, end user constraints around …
Physical Layer Compliance Testing for 10GBASE-T
10GBASE-T Ethernet introduces new challenges for design and test. Find out about tools that deliver proper and optimal electronic testing for the validation of your 10GBASE-T designs in this …
How Do You Get the Most Out of Your Tektronix Performance Oscilloscope
Understand the important signal acquisition and usability features of your oscilloscope to achieve quicker results. This application will show you several features of the DPO7000 and DPO/DSA70000B …
Highly Reliable Testing of 10-Gb/s Systems (STM-64/OC-192)
Meeting the Growing Need for BandwidthThe growth of the Internet, e-commerce, virtual private networks, IP telephony, and other data-centric applications, is prompting a demand for increased bandwidth …
TCP/IPv4 and Ethernet 10BASE-T/100BASE-TX Debugging with the MSO/DPO4000B Series Oscilloscopes
This application note covers the overall view of the Internet Protocol Suite and the operation of each layer and concludes with working with Ethernet 10BASE-T and 100BASE-TX signals with the …
Title
High Speed Serial Data Receiver Testing Webinar
This webinar discusses the challenges in generating signals with increasing speeds for the latest serial standards and for thoroughly testing any receiver with "real world" or "worst case" conditions …
Ultra-Wideband Technology and Test Solutions Including WiMedia Webinar
WiMedia UWB is a rapidly growing technology that promises to revolutionize low power, short range wireless applications. It has quickly emerged as a leading technology for applications such as …
Jitter Fundamentals
View this recorded webinar to get a solid overview of jitter components as well as jitter characterization and visualization. Learn how to control Jitter during system design and improve timing …
Title
MIPI D-PHY Test Method of Implementation (MOI)
Overview:This selection of tests verifies various Electrical Characteristic requirements of D-PHY* products defined Section 8 of the D-PHY* Specification, version 0.9. Group 1 (8.1.x) verifies the …
MIPI® M-PHY Methods of Implementation
This document contains he MIPI® M-PHY* Measurements & Setup Library Methods of Implementation (MOI) for Verification, Debug, Characterization, Conformance and Interoperability Test
Methods of Implementation (MOI) for Verification+ Debug and Characterization
This document covers the Method of Implementation (MOI) for DPOJet measurements provided in the DPO70000 Option PCE, Option PCE3, and Option PCE4 solutions packages.
PCI Express 3.0 De-embedding Method of Implementation Version 1.0
This document will provide a step-by-step procedure for extracting the Sparameters from the test channel of the PCI Express Gen 3 so it can be used for the purpose of removing the effects from the …
10BASE-T Method Of Implementation (MOI)
Tektronix Test Methods of ImplementationThis Tektronix guide to measurements document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied …
100BASE-TX Method of Implementation (MOI)
Tektronix Test Methods of ImplementationThis Tektronix guide to measurements document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied …
1000BASE-T Method of Implementation
Tektronix Test Methods of ImplementationThis Tektronix guide to measurements document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied …
PCI Express 3.0 Receiver Test MOI for CEM Spec
This document covers the Method of Implementation (MOI) for PCI Express 3.0 CEM receiver testing, using BERTScope instruments. The document includes a step-by-step description of required hardware …