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Product Support and Downloads

Welcome to Tektronix Product Support

While we’re happy to “talk tech” with you all day long, we know you’re in a hurry. So we’ve made it easy for you to download manuals, datasheets and software for all our current products, and many discontinued products as well. Just tell us which product you’re using, and we’ll show you everything we have.

The product model you have chosen is currently available for purchase. The following support information is available.

  • マニュアル マニュアルの種類 部品番号: リリースの日付
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069604
    Tektronix BERTScope

    Clock Recovery Instruments Quick Start User Manual

    主要ユーザ 071285202
    Tektronix BERTScope

    BSAPCI3 Instructions

    User 071304600
    Tektronix BERTScope

    Clock Recovery Declassification & Securities Instructions

    機密解除 077110200
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069602
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069605
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069601
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069603
  • 技術情報 ドキュメントの種類 リリースの日付
    Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
    Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards to provide a significantly more complete picture
    アプリケーション・ノート 04 Feb 2020
    PCI Express® Transmitter PLL Testing — A Comparison of Methods
    There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of use, ease of setup, and initial cost. In addition, s
    入門書 04 Feb 2020
    Stressed Eye Primer
    In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.
    入門書 04 Feb 2020
    Stressed Eye: “Know What You’re Really Testing With”
    BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.
    入門書 04 Feb 2020
    Stress Calibration for Jitter >1UI
    While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for
    アプリケーション・ノート 04 Feb 2020
    2020 Tektronix and Keithley Product Catalog
    We have the right products to ensure your success. Browse our new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You’ll find over 130 pages of key product details and specifications, applicat
    選択ガイド 04 Feb 2020
    Evaluating Stress Components using BER-Based Jitter Measurements
    This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally sho
    入門書 04 Feb 2020
    Clock Recovery Primer, Part 1
    Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
    入門書 04 Feb 2020
    Clock Recovery’s Impact on Test and Measurement
    As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and how it is clocked. By understanding the relationship
    アプリケーション・ノート 04 Feb 2020
    Clock Recovery Primer, Part 2
    Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
    入門書 04 Feb 2020
    Comparing Jitter Using a BERTScope® Bit Error Rate Testing
    Comparison of DCD and F/2 Jitter.
    アプリケーション・ノート 04 Feb 2020
    Dual-Dirac+ Scope Histograms and BERTScan Measurements
    This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.
    入門書 04 Feb 2020
    アイ・ダイアグラムの構造分析
    このアプリケーション・ノートは、アイ・ダイアグラムとは何か、その構造、アイ・ダイアグラム生成のための一般的なトリガ方法について説明します。また、アイ・ダイアグラムをスライスすることで得られるさまざまな情報についても説明します。さらに、トランスミッタ、チャンネル、レシーバ・テストの基本的な方法についても説明します。この分野に馴染のないエンジニアでも、一般的に使用される概念がわかるように書かれています。
    アプリケーション・ノート 26 Dec 2019
    BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
    Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter decomposition on long patterns such as PRBS-31.  
    アプリケーション・ノート 04 Feb 2020
    BERTScope™ CR125A+ 175A+ & 286A Clock Recovery Fact Sheet
    Key Specs and Ordering Information for BERTScope CR125A, 175A, & 286A Clock Recovery.
    ファクト・シート 04 Feb 2020
    BER等高線入門-アイ・ダイアグラムとBER
    このアプリケーション・ノートでは、BER等高線測定の概要について説明します。具体的には、BER等高線とは何か、どのように構成され、ギガビット・スピードでのパラメータ性能に有効な観測方法である理由について説明します。さらに、BERTScopeビット・エラー・レート・テスタiによるBER等高線の例についても説明します。
    アプリケーション・ノート 26 Dec 2019
    Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
    Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterization example using a Single Mode 1310 nm laser SFP+
    入門書 04 Feb 2020
  • ソフトウェア ドキュメントの種類 部品番号: リリースの日付
    BERTScopePC Software V 10.9.1024
    The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to
    Application 1000000482
    BERTScopePC Software, V 10.15.1284
    The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125, DPP125B, DPP125C)and BSAITS instruments that are being operated as stand-alone instruments, i.e. not co
    Application 063430803
    BERTScopeCR Help File V1.0
    BERTScope Clock Recovery Instrument Help File for offline use.
    Application 066130900
    BERTSCOPE PC APPLICATION SOFTWARE - V12.04.5522
    The BERTScope PC software provides for PC control of BERTScope Clock Recovery (CR125A, CR175A, CR286A) and Digital Pre-Emphasis Processor (DPP125B) instruments that are being operated as stand-alone instruments, i.e. not connected directly to a BERTS
    Application 063430806
  • Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
    期間: 1m 16s
    The physical setup for USB 3.1 receiver calibration and testing is shown in this video.
    期間: 4m 33s
    This video focuses on the Link Training Status State Machine UI feature of the USB 3.1 Gen2 Receiver test application and shows the path that is taken by a device being trained into loopback mode ...
    期間: 4m 35s
    The USB 3.1 Receiver application's Margin Test feature gives engineers quantitative answers on a design's performance and as a debug tool, a better understanding of where devices fail. This video ...
    期間: 3m 34s