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  • データシート 文書番号: リリースの日付
    Bit Error Rate Tester
    The BERTScope Bit Error Rate Tester Series provides a new approach to signal integrity measurements of serial data systems. Perform bit error rate detection more quickly, accurately, and thoroughly by bridging eye diagram analysis with BER pattern …
    65W-25444-15
    M-PHY Receiver Solution Datasheet
    GRL’s MIPI MPhy Receiver Calibration and Test Application Software for the Tektronix BERTScope™ BSA(GRL-MIPI-MPHY-RX) provides an automated, simple, and efficient way to test MIPI MPhy Receiver to the Jitter Tolerance and other test requirements of …
  • マニュアル マニュアルの種類 部品番号: リリースの日付
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069605
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069604
    Tektronix BERTScope

    Bit Error Ratio Analyzers & Pattern Generators Quick Start User Manual

    主要ユーザ 071286904
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069603
    Tektronix BERTScope

    BSAPCI3 Instructions

    User 071304600
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069602
    Tektronix BERTScope

    Bit Error Ratio Analyzers & Pattern Generators Quick Start User Manual.

    主要ユーザ 071286903
    Tektronix BERTScope BSA Series

    Declassification and Security Instructions

    機密解除 077079100
    Tektronix BERTScope

    BSAITS125 Declassification & Securities Instructions

    機密解除 077069500
    Tektronix BERTSCOPE

    BSAITS Quick Start User Manual

    主要ユーザ 071304500
    ITSRACK

    Rackmount Instructions

    User 071305100
    Tektronix BERTScope

    BSA & BA Remote Control Guide Programmer Manual

    プログラマ 077069601
    BERTScope Analyzers

    BERTScope Bitalyzer Remote Control Guide Programmer Manual

    プログラマ 077067700
    BERTScope Analyzers

    BERTScope Bitalyzer Remote Control Guide Programmer Manual

    プログラマ 077055400
    BERTScope Analyzers

    BERTScope Bit Error Ratio Analyzer Instructions Quick Start User Manual

    User 077055200
    Tektronix BERTScope

    Bit Error Ration Analyzers & Pattern Generators Quick Start User Manual

    User 071286900
  • 技術情報 ドキュメントの種類 リリースの日付
    テクトロ、100Gの光レシーバテスト対応のビットエラーレートテスタを発表 -マイナビニュース [2014/05/21]
    テクトロニクス社は5月21日、BERTScopeビットエラーレートテスタ「BSA286CL型」を発表した。
    製品資料
    BER等高線入門-アイ・ダイアグラムとBER
    このアプリケーション・ノートでは、BER等高線測定の概要について説明します。具体的には、BER等高線とは何か、どのように構成され、ギガビット・スピードでのパラメータ性能に有効な観測方法である理由について説明します。さらに、BERTScopeビット・エラー・レート・テスタiによるBER等高線の例についても説明します。
    アプリケーション・ノート
    Tektronix Leads in Innovation as Six Products Named Finalists for Best in Test Awards
    Following Nomination by Test & Measurement World Editors, Online Voting Continues through DecemberBEAVERTON, Ore., Dec. 14, 2012 - Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, today announced that …
    プレス・リリース
    Tektronix Introduces Most Comprehensive, Automated PCI Express 3.0 Tx, Rx Test Suite
    Comprehensive Receiver and Transmitter Solutions Give Silicon, Hosts and Card Designers One Stop for PCIe 3.0 Testing and DebugBEAVERTON, Ore., Oct. 23, 2012 - Tektronix, Inc., the world's leading manufacturer of oscilloscopes, today announced the …
    プレス・リリース
    テクトロニクス、USB 3.1の統合コンプライアンス・ソリューションを発表
    報道発表資料2015年1月21日10Gbpsのトランスミッタ/レシーバの自動テスト、USB PD、USB Type-Cケーブル・テストを含んだ統合テスト・ソリューションテクトロニクス(代表取締役 米山 不器)は、本日、最新のUSB規格に対する設計検証をすばやく実行し、最小のコストで製品をいち早く市場に投入するための、USB 3.1の統合テスト・ソリューションを発表しました。今回の発表は、すでに発表しているUSB 3.1、USB 2.0のテスト機能を強化するものであり …
    プレス・リリース
    アイ・ダイアグラムの構造分析
    このアプリケーション・ノートは、アイ・ダイアグラムとは何か、その構造、アイ・ダイアグラム生成のための一般的なトリガ方法について説明します。また、アイ・ダイアグラムをスライスすることで得られるさまざまな情報についても説明します。さらに、トランスミッタ、チャンネル、レシーバ・テストの基本的な方法についても説明します。この分野に馴染のないエンジニアでも、一般的に使用される概念がわかるように書かれています。
    アプリケーション・ノート
    100Gbps通信システムの物理レイヤ・テスト
    このアプリケーション・ノートでは、100Gシステム構築に必要なトランスミッタ/ レシーバのテストについて説明します。25+Gbpsのどのハイスピード・シリアル技術も同様の方式であるため、このアプリケーション・ノートでは100GbEのコンプライアンス要件にしたがって説明し、Fibre Channelの32GFCなどの高速レート・システムとの差異については、その都度説明します。25~28Gbpsの電気シグナリングなど、100GbE仕様に差異がある場合は、OIF-CE(I Optical …
    アプリケーション・ノート
    USB 3.1 Receiver Compliance Testing
    In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.        
    アプリケーション・ノート
    Stressed Eye Primer
    In addition to an introduction to stressed eye testing, this primer discusses some of the high-speed standards that use it, and how a receiver test using stressed eye is constructed.
    入門書
    Stressed Eye: “Know What You’re Really Testing With”
    BER-based measurements can provide a better view of the stress eye opening down at the deep BER levels that the receiver will be expected to operate at when it is tested.
    入門書
    Stress Calibration for Jitter >1UI
    While measuring the amount of jitter present on a signal is relatively straight forward conceptually; when the levels of jitter are small, amounts above a bit period (1 unit interval or UI) can be more difficult. This has practical consequences for …
    アプリケーション・ノート
    Six Sigma’ Mask Testing with a BERTScope® Bit Error Rate Tester
    Six sigma is a form of mask testing that provides for critical insight when mask testing depth specification are important for pass/fail testing or deeper evaluation on high-speed signaling standards to provide a significantly more complete picture …
    アプリケーション・ノート
    Signal Integrity of Reference Clock Bleed-Through in an IC
    This application note examines some signal integrity examples related to AMB testing, but also with wider applicability. Clock bleed-through is examined, as well as the effect of a lowered supply voltage on error performance.
    アプリケーション・ノート
    Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate
    Study the measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard, covering both Multi- Mode 850 nm and Single Mode 1310 nm interfaces. Included is a test and characterization example using a Single Mode 1310 nm laser SFP+ …
    入門書
    Comparing Jitter Using a BERTScope® Bit Error Rate Testing
    Comparison of DCD and F/2 Jitter.
    アプリケーション・ノート
    Clock Recovery Primer, Part 1
    Part 1 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
    入門書
    Clock Recovery’s Impact on Test and Measurement
    As clock recovery becomes increasingly common in more systems and test setups, its effects on measurements must be considered. Many outside influences can disturb the relationship between data and how it is clocked. By understanding the relationship …
    アプリケーション・ノート
    Clock Recovery Primer, Part 2
    Part 2 of looking at clock recovery from a practical point of view with emphasis on how it affects measurements.
    入門書
    Evaluating Stress Components using BER-Based Jitter Measurements
    This primers describes how jitter measurements can be self-verified using a BER-based Jitter Peak measurement and how to simplify the jitter measurement challenge by using a pattern that does not contribute pattern-dependent effects, and finally …
    入門書
    Exploring Power Supply Voltage Sensitivity in an IC with a BERTScope® Bit Error Rate Tester
    Eye diagrams alone may not be as effective in showing major system issues and should be coupled with BER-based measurements for deeper insight and problem resolution.
    アプリケーション・ノート
    Exploring Power Supply Voltage Sensitivity in an IC with a BERTScope® Bit Error Rate Tester
    Eye diagrams alone may not be as effective in showing major system issues and should be coupled with BER-based measurements for deeper insight and problem resolution.
    アプリケーション・ノート
    BERTScope® Bit Error Rate Testers Jitter Map “Under the Hood”
    Delve into jitter problems in new ways, such as examining Random Jitter on each edge of the data pattern, separating out the jitter caused by transmitter pre-emphasis, and performing jitter decomposition on long patterns such as PRBS-31.  
    アプリケーション・ノート
    BSA Series BERTScope Bit Error Rate Testers Fact Sheet
    This BERTScope Fact Sheet contains key specs and ordering information for the BSA Series BERTScope Bit Error Rate Testers.
    ファクト・シート
    Dual-Dirac+ Scope Histograms and BERTScan Measurements
    This primer discusses how the dual-Dirac relates to practical measurements that can be made with sampling scopes and BER-based instruments.
    入門書
    D.C. Blocks, a Trap for the Unwary When Using Long Patterns
    It is obvious to focus on ensuring that the upper frequency of the range is adequate to pass the desired data signal; while it is less obvious to worry about the low end frequency specification, this application note discusses that it can be equally …
    アプリケーション・ノート
    PCI Express® Transmitter PLL Testing — A Comparison of Methods
    There are several methods of measuring PLL loop response, based on the type of test instrumentation used. As expected, the various methods trade off test accuracy, test speed (throughput), ease of use, ease of setup, and initial cost. In addition …
    入門書
    Practices for Measurements on 25 Gb/s Signaling
    This application note describes the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems. Focus is on oscilloscope measurements, with some comments on BERTs.
    アプリケーション・ノート
    High Speed Interface Standards
    This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical resources that will help you understand design …
    使用方法ガイド

    アプリケーション・ノート
    2020 Tektronix and Keithley Product Catalog
    We have the right products to ensure your success. Browse our new Tektronix and Keithley Product Catalog and explore our complete line of test and measurement solutions. You’ll find over 130 pages of key product details and specifications …
    選択ガイド
  • ソフトウェア ドキュメントの種類 部品番号: リリースの日付
    BERTScope Software Release
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern …
    Application 066123808
    Tektronix Receiver Test Application Software for USB3.1 Gen1 and Gen2 - V2.3.0
    USB 3.1 Gen1 and Gen2: Testing is described in the USB-IF Compliance Test Specification (CTS) document. Receiver testing is accomplished by connecting the output of a BERT pattern generator as an input to the DUT, through a specialized set of …
    Application 066195002
    BERTScope Application Software, V11.02.1903
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …
    Application 066165804
    BSAUSB31 USB 3.1 Receiver Test Application Software, V1.1.1907
    The BERTScope USB 3.1 Receiver Test Automation Software runs on a BERTScope or PC, and connects to the BERTScope, DPP, CR, and Instrument Switch test equipment via LAN. It uses remote control automation protocols to fully automate USB 3.1 calibration …
    Application 066171100
    BERTSCOPE APPLICATION SOFTWARE, V11.02.1886
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …
    Application 066165802
    BSAPCI3 PCIe 3.0 Receiver Test Application Software, V1.1.1449
    The PCIe 3.0 Receiver Test Automation Software (BSAPCI3) runs on a BERTScope or peripheral PC, and connects to a BERTScope and DPP (Digital PreEmphasis Processor) test equipment via LAN. It uses remote control automation protocols to fully automate …
    Application 066156501
    BERTScope Software Release, V 10.15.1284
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 28.6 Gb/s. They are the industry`s first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER …
    Firmware 066148402
    BERTScope Driver for LabVIEW V1.0.2
    BERTScope? and BERTScope? S Driver for LabVIEW Version 1.0.2 Release Date: June 1, 2006
    Driver 066130500
    BERTScope Software Release V 10.11.1006
    BERTScope(R) Analyzers are designed for applications from 500 Mb/s to 26 Gb/s. They are the industry's first multi-Gb/s instruments that combine the eye diagram analysis capabilities of high-bandwidth sampling oscilloscopes together with BER pattern …
    Firmware 066123802
    Bertscope Software Support - Jitter Tolerance Template files V1.0
    BERTScope Template files to be used with the Jitter Tolerance applications.
    Waveform 066125000
    Bertscope USB 3.0 Support files V1.0
    The compressed file has the User patterns, Mask, JTOL and Configuration files for the Bertscope USB 3.0 application.
    Waveform 066124700
    Bertscope SATA Support files V1.0
    The compressed file has the BERTScope User patterns and JTOL files for the Bertscope SATA application.
    Waveform 066124800
    Bertscope PCI Express Support Files V 1.0
    The compressed file has BERTScope User patterns, Mask Files and Jitter Tolerance files for the Bertscope PCI Express Application.
    Waveform 066124600
    Bertscope SAS Support files V1.0
    The compressed file has the BERTScope User patterns and Jitter Tolerance files for the Bertscope SAS application.
    Application 066124900
  • Get an overview of the optical solutions available from Tektronix. Learn about what we showcased at our OFC 2016 exhibit, then learn more about these solutions online.
    期間: 1m 16s
    In this video we look at a topic that is becoming increasingly important in the high-speed serial industry—how to perform embedded measurements at the IC or PCB level using probes.
    期間: 4m 14s
    View this demonstration of interoperability at OFC2013 using Tektronix DSA8300 Sampling Oscilloscope and BSA286C BERTScope. Tektronix assisted the Optical Internetworking Forum (OIF) and member …
    期間: 4m 56s
    Designing and developing 100G components, modules and systems requires the latest tools and techniques. In this video, you'll learn how to:Set up a complete system for active optical cable …
    期間: 2m 7s
    Python® is one of the preferred software environments to implement test strategy automation, due to its portability, ease of use, and scalability.  This webinar provides a good understanding of …
    期間: 37m 53s
    Watch our webinar to learn about characterization, compliance test and validation of new designs for USB 3.1 and the Type-C Connector. You’ll see how you can simplify your validation tasks and …
    期間: 31m 46s
    Learn how to address the test and measurement challenges posed by PCIE Gen1-5 for both base silicon testing and CEM compliance testing. Gain insights and solutions for automation, validation, and …
    期間: 41m