ケースレー超低抵抗構成

ケースレー超低抵抗構成

2182A型と6220型または6221型を接続して、単一の機器のように動作させることができます。 2182A/622X型の組み合わせは、他のソリューションよりもはるかに優れ、抵抗測定、パルスI-V測定、および微分コンダクタンス測定に最適です。 2182A/622X型の組み合わせは、ナノテクノロジ関連の多くの用途にも適しています。結果の無効化や被測定デバイス(DUT)の破損を引き起こすような大きな電力消費を発生させることなく、抵抗を測定できます。

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ケースレー超低抵抗構成6200/2182A型

特長

利点

10nΩ~100MΩの抵抗を測定可能 測定レンジがきわめて広く、超低抵抗測定に特化しているため、高伝導材料、ナノ材料、および超電導材料の特性評価に適しています。
電流パルス・ソースと50 µsレベルの測定時間の同期 電力レベルをきわめて低くしてテストしないと簡単に壊れてしまうコンポーネント(ナノデバイスやナノ材料など)の電力消費を制限できます。
デルタ・モード電流反転による抵抗測定技術 熱オフセットの効果をなくして高確度な超低抵抗測定を実現し、1回の読み値のノイズを30 nVp-p(標準値)まで低減します。 複数の読み値を平均して、ノイズを大幅に低減できます。
微分コンダクタンス測定 他のコンダクタンス測定技術と比較して、速度が10倍速く、ノイズも減ります。 複数のスイープの結果を平均しなくても、優れた測定値が得られます。
ナノボルトメータと電流ソース・インタフェースのシームレスな連動 微分コンダクタンス測定や抵抗測定を行うときに2つの機器を単一の機器のように動作させることができます。
デルタ・モード、微分コンダクタンス、およびパルス・モードによる電流過渡の最小化 電流スパイクによって故障しやすいデバイスの特性評価を行うことができます。
データ・シートアクセサリ説明
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