As the number of low power circuits increase in designs for mobile devices and computers, validation testing and debug becomes more challenging. Also, increasing board and component density is leaving little space for probing. In addition, loading from oscilloscope probes can become a critical issue impacting system operation. And lastly, low power devices transmit low amplitude signals making the low noise performance of the probe and oscilloscope very important.
If you need to test components and systems, this webinar will teach you what you need to consider when you probe low power components and show you can test more successfully.
You will learn:
- Techniques for connecting to high performance, low power designs
- Probing considerations such as loading and noise
- Overview of new probing technologies that minimize the impact on low power circuits
- Techniques for de-embedding the effect of probes on the measurement results
Learn new ways to make probing and testing lower power circuits more easily and with greater success.