テクトロニクス担当者とライブ・チャット： 午前9時～午後5時00分 JST
Simplifying FET Testing with Series 2600B System SourceMeter SMU Instruments
This application note explains how to simplify I-V measurements on FETs using a Series 2600B System SourceMeter SMU Instrument with the TSP® Express embedded software tool.
The Series 2600B family of one- and two-channel SMUs offers a range of instruments ideal for electrical characterization of FETs that can source and measure over a wide range of voltage and current. These SMUs have current resolution to 0.1fA and can be current limited to prevent damage to the device. The TSP Express software tool simplifies performing common I-V tests on FETs and other semiconductor devices, without programming or installing software.