Optical Storage Analysis and Measurement Software

Features & Benefits

• Automatic Industry-specific Optical Storage, Amplitude and Timing Measurements Help Characterize Designs Efficiently
• TekFlex™ Feature Offers Unprecedented Flexibility to Modify Signal Processing Blocks - Equalizer, Low Pass Filter, Slicer and PLL - to Develop Next-generation Optical Designs
• Digital Phosphor Technology Delivers the Complex RF Eye Display as Previously Seen Only on Analog Oscilloscopes
• Automatic Determination of Clock Period for Advanced Constant Angular Velocity (CAV) Drives for Easier and More Accurate Analysis
• Tracking Error Counter Enables Users to Determine Tracking Error Count
• Input Block Diagram Allows Bypassing of Various Signal-processing Blocks
• Time Interval Analysis (TIA) Display Provides Histogram Display of Pulse Width Measurements Over T Values
• Five Display Modes - Summary, List by nT, Plot, Histogram and List - Enable Users to View the Output in Various Formats for In-depth Analysis
• Statistical Information Including Mean, Max, Min, Average and Standard Deviation Offers Greater Insight into Signal Behavior

Applications

• Design and Debug of DVD, CD and MO
• Development of Next-generation Optical Systems
• Development of Systems Beyond Current ECMA Standards

Optical Storage Analysis and Measurement Software Package

The TDSDVD optical storage analysis and measurement software package, coupled with Tektronix TDS5000, TDS7000 and CSA7000 Series digital phosphor oscilloscopes, is the first test tool to deliver the flexibility, analysis, time interval display, automatic industry-specific measurements, and familiar, analog-like display for design and test engineers developing state-of-the-art optical storage systems. This superior test solution combines the capabilities of an analog oscilloscope, digital oscilloscope and jitter analyzer into one simple-to-use tool that provides complete system characterization and allows designers to maximize the performance of existing systems and next-generation designs.

TekFlex™ Delivers an Ideal Design Solution for Next-generation Optical Storage Systems

TDSDVD's TekFlex feature enables designers to develop next-generation designs or optimize the performance of existing optical storage systems beyond current ECMA standards by allowing them to modify or substitute various signal processing blocks, such as the Equalizer, Low pass filter, Slicer and PLL. When installed on a PC, the TDSDVD application software utilizes the exceptional computational power of the workstation to make complex calculations sometimes required when fine-tuning intricate designs.

Automated Analysis and Measurements

The long record length of the TDS5000, TDS7000 and CSA7000 Series oscilloscopes, coupled with the powerful capabilities of the TDSDVD software package, combine the benefits of an analog oscilloscope, digital oscilloscope and jitter analyzer into one easy-to-use instrument for complete system characterization. With this tool, designers can view the RF signal eye-pattern and perform detailed analysis.

Accurate, comprehensive and easy-to-perform amplitude and timing measurements coupled with advanced analysis capability help users to characterize designs efficiently. TDSDVD software automatically detects the clock period and uses the extracted clock period T to make timing measurements. Effects of Inter-symbol-interference can be determined by analysis of Data-to-Clock Edge shift.

The TDSDVD software package permits emulation of drive characteristics to enable users to perform measurements independent of any specific hardware and allows the user to view data at various test points. Using DSP techniques, the user's signals are conditioned using software Equalizer, Low Pass Filter, Slicer and PLL functions. The time interval analysis (TIA) display provides the data-pulse-width measurement as a histogram display plotted over T values.

TDSDVD's record scan feature offers easy navigation and saves time by automatically comparing sections of the same waveform or different waveforms for defects through multiple gated regions on a long record length waveform.