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Keithley’s 2601B-PULSE System SourceMeter product image
Speeding up Failure Analysis using Lock-in Thermography Thursday, February 4, 2021
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail in the lab in order to prevent failures in the field. Countless hours are spent by failure analysis (FA) engineers trying to understand why a device failed and how it can be prevented in the future. This is vital as many devices are used in mission critical applications where “failure is not …
How Keithley’s New 2601B-PULSE Can Help Vertical Cavity Surface Emitting Laser (VCSEL) Designers Save More Lives Tuesday, April 21, 2020
It’s late at night and you’re driving home. You’re tired and just want to get to bed. But then, all of a sudden, you are faced with a big animal in the middle of the road. Immediately, your car slams on the brakes to prevent you from hitting the animal and from swerving off the road. Through the technology of light detection and ranging – better known as LIDAR, your vehicle has protected you from …