400G対応光/電気Tx

テクトロニクスは、400Gネットワーク技術のTx、コヒーレント光の規格適合テストを行うためのサポート、専門技術、および機器を提供しています。テクトロニクスは、NRZやマルチレベル変調だけでなく、複雑なコヒーレント変調フォーマットもサポートした包括的な400Gbpsトランスミッタ・テスト・ツールを提供している唯一のテスト/計測器メーカです。

テクトロニクスのTxテスト・ソリューション

DPO70000SXシリーズ・リアルタイム・オシロスコープは、あらゆる設計に対応できる優れたデバッグ/解析機能を備えており、400Gテストの複雑なテスト手順を大幅に簡素化できます。

  • DPO70000SXシリーズ用のPAM4ソフトウェアは、最新のOIF-CEI/IEEE規格に完全に対応した、優れた400G測定機能を提供しています。データ・シート »
     

DSA8300シリーズ・サンプリング・オシロスコープは、きわめて広いダイナミック・レンジを備えており、電気/光ベースのPAM4およびTDECQ(Transmitter Distortion Eye Closure Quaternary)ベースの測定に不可欠な詳細な特性評価が行えるため、研究開発にも製造テストにも最適です。

  • DSA8300シリーズ用のPAM4ソフトウェアは、最新のOIF-CEI/IEEE規格に完全に対応した、優れた400G測定機能を提供しています。データ・シート »

テクトロニクスの100Gソリューション »

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ライブラリ

Title
100G/400G Datacom Transmitter Measurements: Determining Proper Measurement Tools for 100G/400G Datacom Testing

This application note walks through a number of common misconceptions and key considerations to help you select the proper scope technology (RTO vs. ETO) for your needs.

Overcoming SNDR Measurement Challenges in 100G, 400G Datacom Testing

With important changes occurring in transmitter characterization and measurement methods for 100G and 400G standards (both IEEE and OIF-CEI) it is vital to learn more about SNDR and its advantages, key instrument considerations to account for, and how acquisition bandwidth influences SNDR noise parameters and more.

This video highlights the benefits of using the DPO70000SX real time oscilloscope…

4:02

See a 100G/400G research and development solution including new optical-to-…

4:02

Watch our highlights overview of OFC 2017! 

1:42

See a 100G/400G research and development solution including new optical-to-…

4:02

Watch this video to get an overview of the new Link Training Tool, which forms…

1:31

The accelerated development of 400G Ethernet technology is driving new…

1:00:12
Title
Effective Optical Test Strategies for 400G Optical Standards

This webinar discusses how designers and test engineers can determine the most effective optical test strategies for 400G Optical Standards. Learn where PAM-2 and PAM-4 fits, PAM-4 specific Mask Testing- rethinking hit ratios, what is TDEC and how is TDECQ different, and much more.

PAM4 Electrical Webinar

This presentation will review PAM4 measurement methodologies and expand on emerging needs related to FFE reference equalization, clock recovery challenges, BER measurement needs as well as SNDR as it relates to multi-level signaling. 

Maximizing Margins for 4th Gen High Speed Serial Standards

As data rates increase, the effect of cables and fixtures become a larger part of the overall measurement result. Gain insight into the issues and how to solve them for each step of the signal path from the device under test to the oscilloscope.

Electrical Validation of the Type-C Interface

The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. This webinar explores the latest updates to the Type-C specification, as they pertain to USB3.1, DisplayPort, and Thunderbolt standards, including Power Delivery.

Practical 400G PAM4 Test Methods - Optical and Electrical Measurement

The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring PAM4 signals for optical and electrical systems. This presentation will review both of these two very different technology fronts and discuss practical elements of physical layer PAM4 testing ranging from 50mm based CEI-XSR specs to 10Km 400GBASE-LR8.

NBASE-T and IEEE802.3bz Technology and Measurements

The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. An overview of NBASE-T and the emerging IEEE802.3bz standard, as well as key measurement challenges, will be presented in this webinar.

New Technologies for Probing Low Power Circuits Webinar

As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging.

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