100G対応光/電気Tx/Rx

テクトロニクスは、100G規格に対応した包括的なTx/Rxテストをサポートするとともに、NRZやPAM4といった信号だけでなく、 複雑なコヒーレント変調 フォーマットのテストに役立つ機能を提供しています。テクトロニクスのテスト機器があれば、次世代データコム技術にも対応できます。

  • DPO70000SXシリーズ・リアルタイム・オシロスコープ は、製品の技術的な優位性を効率的に証明する優れた手段を提供し、100G電気技術規格に対応したデバッグと検証をすばやく行えます。業界トップクラスの優れたノイズ・フロアとサンプル・レートにより、お客様の100G設計の性能を明確に実証できます。
    • 新製品!MSO/DPO70000シリーズ・オシロスコープで DPO7OE1型光プローブ を使用すると、PAM4/NRZ信号のソフトウェア・クロック・リカバリ、トリガ、エラー検出、時間相関の取れた解析や連続するアクイジションの処理など、強力なデバッグ機能が追加されるため、光デバイスのトラブルシューティングを効率化できます。
  • DSA8300型サンプリング・オシロスコープ は、光信号・雑音比(OSNR)がきわめて低い業界トップクラスの光リファレンス・レシーバを内蔵し、シングルモードの主要な光規格に対応した光トランスミッタの正確な特性評価に最適です。
    • 新製品!DSA8300型用の 80C17型および80C18型光モジュール は、業界トップクラスのマスク・テスト感度と低ノイズ性能、さらに生産能力を高め、歩留まりを向上させるのに役立つ新機能を備えているため、100G設計を製品化する動きにも対応できます。
  • CR286A型クロック・リカバリ・ユニット は、ほとんどの100Gbps規格に対応しており、テクトロニクスのサンプリング・スコープおよびBERTとの連携により、正確なタイミング測定解析に必要な安定したクロックを実現します。
  • BERTScope BSAシリーズ・ビット・エラー・レート・テスタ は、PRBS信号の長いパターンを生成でき、またBER測定結果が非常に正確で、深層に横たわる根本原因の解析に最適です。

 

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Title
Extinction Ratio (ER) Calibrated White Paper

This white paper explains some of the benefits of highly accurate ER measurements in both 10 GbE (Ethernet), with its relatively low ER requirement, and in SONET/SDH, and the methodology that supports consistent, accurate ER result.

BER等高線入門-アイ・ダイアグラムとBERBridging the Gap Between BER and Eye Diagrams
Clock Recovery Primer, Part 1

Look at clock recovery from a practical point of view, Part 1.

32 Gbit/s QPSK Transmission at 385 GHzLearn more about a world record breaking wireless system capable of transmitting data at 400 GHz (0.4 THz) using advanced signal coding (up to QAM-16) and key advanced THz devices in this whitepaper.
Semtech Turns to Tektronix DSA8300 Sampling Scope to Characterize New 25-28 Gb/s CDR DevicesThis customer case study illustrates the benefits that Tektronix DataCom test solutions deliver to characterize electrical performance of 100G technologies with the industry’s lowest intrinsic noise floor.
Practices for Measurements on 25 Gb/s Signaling

Review of the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems with oscilloscopes.

Coherent Optical Signal Generation with High-Performance AWG

Learn how instrument characteristics and performance level of the AWG70000 influence the ability to generate different modulation schemes and the way the instrument’s flexibility can be used to compensate for internal and external device imperfections and to emulate component and link distortions.

Ultralow drive voltage silicon traveling-wave modulator Paper (Optical Society of America)

In this paper from the Optical Society of America, the DSA8300 Series Oscilloscope is being used to verify operation of a broadband modulator with a drive voltage of 0.63 Vpp at 20 Gb/s.

Optical Bandwidth Requirements for NRZ and PAM4 Signaling

Until recently, both optical and electrical bandwidth produced similar results but this is no longer the case with the recent IEEE spec change. This paper clarifies these terms, mathematically shows how they are related, and provides the basis to understand and confidently calculate optical and electrical bandwidth for an optical channel.

Overcoming SNDR Measurement Challenges in 100G, 400G Datacom Testing

With important changes occurring in transmitter characterization and measurement methods for 100G and 400G standards (both IEEE and OIF-CEI) it is vital to learn more about SNDR and its advantages, key instrument considerations to account for, and how acquisition bandwidth influences SNDR noise parameters and more.

At OFC 2018 it’s not just about speed but also interoperability both between…

3:26

See 100G/400G Real-Time and Equivalent Time oscilloscope solutions that enable…

3:38

This video highlights the benefits of using the DPO70000SX real time oscilloscope…

4:02

Watch our highlights overview of OFC 2017! 

1:42

See a demonstration test system for the next generation of optical signaling,…

5:57

Watch this video to get an overview of the new Link Training Tool, which forms…

1:31

The accelerated development of 400G Ethernet technology is driving new…

1:00:12

In this video we look at a topic that is becoming increasingly important in the…

4:13

At this booth, we're demonstrating our DS8300 Digital Sampling Oscilloscope…

2:09

At this ECOC 2016 Demo Station, we're looking at generating a 50+ Gigabaud…

2:49
タイトル
PAM4 Electrical Webinar

This presentation will review PAM4 measurement methodologies and expand on emerging needs related to FFE reference equalization, clock recovery challenges, BER measurement needs as well as SNDR as it relates to multi-level signaling. 

Maximizing Margins for 4th Gen High Speed Serial Standards

As data rates increase, the effect of cables and fixtures become a larger part of the overall measurement result. Gain insight into the issues and how to solve them for each step of the signal path from the device under test to the oscilloscope.

Electrical Validation of the Type-C Interface

The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. This webinar explores the latest updates to the Type-C specification, as they pertain to USB3.1, DisplayPort, and Thunderbolt standards, including Power Delivery.

Practical 400G PAM4 Test Methods - Optical and Electrical Measurement

The accelerated development of 400G Ethernet technology is driving new requirements through the test community as it relates to measuring PAM4 signals for optical and electrical systems. This presentation will review both of these two very different technology fronts and discuss practical elements of physical layer PAM4 testing ranging from 50mm based CEI-XSR specs to 10Km 400GBASE-LR8.

NBASE-T and IEEE802.3bz Technology and Measurements

The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. An overview of NBASE-T and the emerging IEEE802.3bz standard, as well as key measurement challenges, will be presented in this webinar.

New Technologies for Probing Low Power Circuits Webinar

As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging.

Characterizing Coherent Optical Systems Webinar

Learn about the coherent modulation being considered for 400G networks, the key building blocks of a coherent test system, how to optimize measurement accuracy and the benefits of customizable analysis for non-standard testing.

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